Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back The high level models based on functional tests generation for pipelined processors Belkin V.V., Sharshunov S.G. An approach to the functional testing of pipelined processors is presented. It is based on functional models, uses instruction set architecture as a source data and allows developing effective tests for pipelined processors. The tests can be used both for verification of microprocessors designs, for manufacturing testing and for self-testing. The ef-fectiveness of presented methodology is evaluated on the microprocessors models. Контактный телефон (4232) 21-13-93. E-mail: belkinvv@mail.ru