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Instruments and Systems: Monitoring, Control, and Diagnostics

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Quality control for thin-film microcircuit board
Spirin V.G.

The article describes developed method for thin-film microcircuit board’s quality control. The method grounds on resistors’ resistance measurement results and on instrumental error calculation. Key words: thin-film microcircuit boards, instrumental errors, quality control method, resistors resistance. Phone: (83147) 4-41-20. E-mail: spvl@ugnn.ru

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