Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back Additive Mathematical Model of Noise Characteristics of Semiconductor Strain Gauge Sensors A.I. SURAYKIN, N.N. BESPALOV, M.S. LABUTIN This article presents the results of a study of the noise characteristics of semiconductor strain gauge sensors. An additive mathematical model has been developed that takes into account thermal, shot, flicker, and process noise, which form the total sensor output signal. Based on a numerical experiment, a spectral analysis using the Welch method was performed, and the integrated noise powers in various frequency ranges were calculated. It was shown that flicker noise dominates in the low-frequency region, thermal noise dominates in the mid- and highfrequency ranges, and drift noise components appear near zero frequency. An analysis of the signal-to-noise ratio revealed its decrease at low frequencies and stabilization at frequencies above 1 kHz. The obtained results confirmed the adequacy of the model and its applicability for predicting the noise characteristics of semiconductor strain gauge sensors. Keywords: strain gauge sensors, noise characteristics, thermal noise, flicker noise, shot noise, mathematical model, power spectral density, signal-to-noise ratio. DOI: 10.25791/pribor.3.2026.1659 Pp. 45-49.