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Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back
Metrological analysis of the positioning device of the optoelectronic device for monitoring large-sized shells of rotation |
A.N. SHILIN, D.G. SNITSARUK
The article proposes a metrological analysis of the device for setting the nominal size of an optoelectronic device for checking the diameters of large-sized shells of revolution. The method of metrological analysis is proposed, which allows choosing the basic parameters of the positioning device reasonably. This technique allows solving a compromise problem between the accuracy of measurement and the dimensions of the device design. To verify the methodology, the values of the parameters of the specific technological process were used.
Keywords: shells of rotation, projection optoelectronic device, positioning device for optoelectronic devices, measurement of geometric parameters, metrological analysis, optical scheme for measuring parts.
Contacts: E-mail: eltech@vstu.ru
Pp. 39-45. |
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