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Instruments and Systems: Monitoring, Control, and Diagnostics

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High temperature semiconductor pressure sensors with enhanced long-term stability
O.I.MARKOV, JU.V. HRIPUNOV

The article is devoted to the control of a condition of a surface of a single crystal of bismuth after are sharp an electroerosive method, mechanical polishing and chemical etching. Researches of a surface were spent by methods of atomic force microscopy. Key words: atomic force microscope, surface, bismuth. E-mail: O.I.Markov@mail.ru. Pp. 56-59

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