Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back Computer-driven automatic control system measuring layer thickness of evaporated thin films Naumov V.V., Grebentshikov O.A., Zalesskiy V.B., Kravchenko V.M. This article describes computer-driven automatic control system measuring layer thickness of evaporated thin films: the implementing device, a technique of measuring and operation algorithm. Контактный телефон (8-10-375-17) 281-32-22. E-mail:solar@inel.bas-net.by