Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back Automatic control of quality and reliability indexes for detecting devices. Bazhanov A.P., Minenko E.Yu. The article presents the function diagram variants for automatic quality and reliability control of detecting devices at the designing stage. The function diagrams are based on formalized models implemented on modern computers. The feature of suggested diagrams is their directivity to permanent scientific trends following (specifically to quality and reliability) relatively to most advanced device in the class. The work is oriented to specialists engaged to the quality and reliability control problems of operating and developing detecting devices of any kind. Key words: detecting devices, quality and reliability indexes, automatic control function diagrams, formalized models. Контактный телефон (8412)49-83-30. E-mail: postmaster@pgasa.pensa.com.ru