Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back Self-control and self-test redundanted digital-analog converter and modeling M.N. SELUYANOV We consider self-redundant digital-to-analog converters and functional testing. It is shown that the combined use of two methods of self-control: paraphase and duplication with comparison of signals makes it possible not only to produce self-control, and self-test DAC. DAC redundant modeling conducted in an environment LabVIEW. Keywords: digital-to-analog converter, redundant, self-control, self-diagnostics, functional testing. Contacts: - Pp. 56-59.