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Instruments and Systems: Monitoring, Control, and Diagnostics

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Self-control and self-test redundanted digital-analog converter and modeling
M.N. SELUYANOV

We consider self-redundant digital-to-analog converters and functional testing. It is shown that the combined use of two methods of
self-control: paraphase and duplication with comparison of signals makes it possible not only to produce self-control, and self-test DAC.
DAC redundant modeling conducted in an environment LabVIEW.
Keywords: digital-to-analog converter, redundant, self-control, self-diagnostics, functional testing.

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Pp. 56-59.

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