Instruments and Systems: Monitoring, Control, and Diagnostics Annotation << Back Nondestructive method for emitting diodes characteristic changes O.I. RABINOVICH E.V. YAKUSHKO The paper presents results of ultrasonic vibrations influence on emitting diodes. It is proposed a non-invasive destructive method of predicting the rapid life emitting diodes. The method allows to forecast the extent of degradation of photometric and electrical characteristics of emitting diodes, to minimize the time required to research and enhance the accuracy of the determination of the causes of degradation and sorting devices by the parameters. It can be used in the design of the production of these devices to define their quality of manufacturing and service life prediction. In particular, the proposed method can be used to determine the quality and optimal choice of welding process modes for the contact conductors to the ohmic contacts of crystals by the thermoultrasonic by welding. Keywords: Light emitting diodes, ultrasonics, GaN, AlGaInN Contacts: E-mail: rabinwork@mail.ru Pp. 56-59.