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Instruments and Systems: Monitoring, Control, and Diagnostics

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Nondestructive method for emitting diodes characteristic changes
O.I. RABINOVICH E.V. YAKUSHKO

The paper presents results of ultrasonic vibrations influence on emitting diodes. It is proposed a non-invasive destructive method
of predicting the rapid life emitting diodes. The method allows to forecast the extent of degradation of photometric and electrical
characteristics of emitting diodes, to minimize the time required to research and enhance the accuracy of the determination of the
causes of degradation and sorting devices by the parameters. It can be used in the design of the production of these devices to define
their quality of manufacturing and service life prediction. In particular, the proposed method can be used to determine the quality
and optimal choice of welding process modes for the contact conductors to the ohmic contacts of crystals by the thermoultrasonic by
welding.
Keywords: Light emitting diodes, ultrasonics, GaN, AlGaInN

Contacts: E-mail: rabinwork@mail.ru

Pp. 56-59.

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